DOCUMENT I

GENESIS ELEMENT BY ELEMENT SUMMARY

ElementAnalytical Technique (a) MaterialArea

(cm2)

Comment
LiSIMS, Au, diamond8 Li diffuses fast in Si. Note (c)
BeSIMS, Si, diamond14 (c)
BSIMS, Si, diamond18 (c)
CGSMS Si, Au46
NGSMS diamond, Si180 (c)
OGSMS diamond80 Contingency for

concentrator target.

FSIMS Si, diamond4 (c)
NeGSMS Al,,AlOS4
NaSIMS diamond, Au4 Na diffuses fast in Si. Note (d)
MgTIMS, SIMS Si100
AlSIMS, Si4
SiGSMS,SIMS Au, diamond100
PSIMS Au, diamond, Si4
SGSMS; SIMS Si, diamond150
ClSIMS Si13 (d)
ArGSMS Al, AlOS4
KTIMS, SIMS Si, diamond, Au168 (b, d)
CaTIMS Si125
ScRNAA Si4
TiTIMS, SIMS, Si150 note (b)
VSIMS Si4 (b)
CrTIMS, SIMS Si150 (b)
MnSIMS, Si4
FeSIMS Au. diamond9
CoRNAA Si4
NiRNAA Si100
CuSIMS Si17 (b,d))
ZnRNAA, SIMS Si13 (b,d)
GaRNAA Si100
GeRNAA, SIMS Si11
AsRNAA Si10
SeRNAA, SIMS Si9 (b)
BrRNAA Si10
KrGSMS Al, AlOS6
RbRNAA, SIMS Si, Au20 (b)
SrSIMS Si, Au4
YSIMS Si, Au4
ZrSIMS Si, Au4
NbRIMS Si4
MoRNAA Si100
RuRNAA Si100
RhRIMS Si4
PdRIMS Si4
AgRNAA Si100 (d)
CdRIMS Si4
InRIMS Si4
SnRIMS Si4
SbRNAA Si100
TeRNAA Si100
IRIMS Si4
XeGSMS Al. AlOS7
CsRNAA Si10
BaTIMS, RNAA Si250 (d)
LaRNAA Si100
CeRNAA Si100
PrRIMS Si4
NdRNAA Si100
SmRNAA Si100
EuRNAA Si100
GdRIMS Si13
TbRNAA Si100
DyRIMS Si13
HoRNAA Si100
ErRIMS Si13
TmRNAA Si100
YbRNAA Si100
LuRIMS Si8
HfRNAA Si100
TaRIMS Si7
WRIMS Si6
ReRIMS Si9
OsRIMS Si4
IrRNAA Si4
PtRIMS Si4
AuRNAA Si10
HgRIMS Si8
TlRIMS Si4
PbRIMS Si13 (d)
BiRIMS Si12
ThRIMS Si13
URIMS Si28

(a) SIMS = secondary ion mass spectrometry

GSMS = gas source mass spectrometry

TIMS = thermal ionization mass spectrometry

RNAA = radiochemical neutron activation analysis.

RIMS = resonance ionization mass spectrometry

RIMS is only listed when it is the only available method of analysis. In principle, all elements except noble gases and F can be analyzed with RIMS. Other techniques are baselined when possible because RIMS is a lesser developed technique at present and because the precision for isotopic analysis is less for RIMS than for TIMS or SIMS, all other factors being equal.

Required precision is 10% for elemental abundances and 1% for isotopic abundances except: C (0.4%), and O (0.1%), Mg, Ca, Ti, Cr, and Ba (0.1% for isotopes with relative abundance greater than 1%).

(b) In this analysis Ge is a superior collector material for SIMS analysis and will be used if sufficiently pure material can be identified in Phase B.

(c) If necessary, diamond from concentrator target can be used for these elements. This is likely to be necessary for B, as it is a ubiquitous terrestrial contaminant.

(d) Care required because of significant sources of surface contamination.


Area Summary (cm2)


Total area = 4008

Si area = 3175

Diamond area = 512

Au area = 221

Al/AlOS area = 100

Available BSW array area = 4732

Fraction used = 0.85.


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