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AUTHOR Potts, P. J.
TITLE A handbook of silicate rock analysis / P.J. Potts.
IMPRINT Glasgow : Blackie ; New York : Chapman and Hall, 1987.
COLLATION ix, 622 p. : ill. ; 29 cm.
NOTE Bibliography: p. 587-610. Includes index.
SUBJECT Rocks, Siliceous --Analysis.
Geology QE438 .P68 1987
AUTHOR Zussman, J.
TITLE Physical methods in determinative mineralogy / edited by J. Zussman.
EDITION 2d ed.
IMPRINT London ; New York : Academic Press, 1977.
COLLATION xiv, 720 p. : ill. ; 24 cm.
NOTE Includes bibliographies and indexes.
SUBJECT Mineralogy, Determinative --Methodology.
Geology QE367 .Z8 1977
Goldstein, et al., Scanning Electron Microscopy and X-ray Microanalysis (A Text for Biologists, Materials Scientists, and Geologists), 2nd ed. New York: Plenum Press, 1992. ISBN 0-306-44175-6. Geology library QH 212.S3 S29 1992 (The first edition of this book is very good too -- Geology QH212.S3 S29 1981)
Chapter 2 Electron Optics
Chapter 3 Electron - Specimen Interactions
Chapter 4 Image Formation and Interpretation
Chapter 5 X-ray Spectral Measurement: WDS and EDS
Chapter 6 Qualitative X-ray Analysis
Chapter 7 X-ray Peak and Background Measurements
Chapter 8 Quantitative X-ray Analysis: The Basics
Chapter 9 Quantitative X-ray Analysis: Theory and Practice
Chapter 10 Compositional Imaging
Chapter 11 Specimen Preparation for Inorganic Materials: Microstructural
and Microchemical Analysis
Chapter 12 Sample Preparation for Biological, Organic, Polymeric, and
Hydrated Materials
Chapter 13 Coating and Conductivity Techniques for SEM and Microanalysis
Chapter 14 Database
The workbook Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy : a laboratory workbook is a companion of sorts for the Goldstein textbook (it is used by the Lehigh short courses). It has exercises that may be used in the lab during more advanced demonstrations, and the answers are in the back of the book!
TITLE Scanning electron microscopy, X-ray microanalysis, and analytical
electron microscopy : a laboratory workbook / Charles E. Lyman [et al.]
IMPRINT New York : Plenum Press, c1990.
COLLATION xi, 407 p. : ill. ; 26 cm.
NOTE Includes bibliographical references and index.
SUBJECT Scanning electron microscopes --Laboratory manuals.
X-ray microanalysis --Laboratory manuals.
Electron microscopy --Laboratory manuals.
ALT AUTHOR Lyman, Charles E.
Millikan 9 Fl QH212.S3 S335 1990
Scanning and transmission electron microscopy: an introduction is another general reference for electron microscopy. It is written with the TEM in mind and does not go into the detail that Goldstein et al does. It is appropriate for those who do not understand anything in the Goldstein text.
Flegler, et al., Scanning and transmission electron microscopy: an introduction. Oxford: Oxford University Press, 1994. Geology library QH212.S3 F58 1993
AUTHOR Flegler, Stanley L.
TITLE Scanning and transmission electron microscopy : an introduction
/ Stanley L. Flegler, John W. Heckman, Jr., Karen L. Klomparens.
IMPRINT New York : W.H. Freeman, c1993.
COLLATION viii, 225 p. : ill. ; 27 cm.
NOTE Includes bibliographical references and index.
SUBJECT Scanning electron microscopy.
Transmission electron microscopy.
ALT AUTHOR Heckman, John William. Klomparens, Karen L.
Geology QH212.S3 F58 1993
The Reimer text Scanning electron microscopy : physics of image formation and microanalysis discusses the physics of imaging and microanslysis, and approaches the subject in a elegant but terse manner. It is at the same or more advanced level than the Goldstein text.
AUTHOR Reimer, Ludwig, 1928-
TITLE Scanning electron microscopy : physics of image formation and
microanalysis / Ludwig Reimer.
IMPRINT Berlin ; New York : Springer-Verlag, c1985.
COLLATION xviii, 457 p. : ill. ; 24 cm.
SERIES Springer series in optical sciences ; v. 45.
NOTE Bibliography: p. [405]-446. Includes index.
SUBJECT Scanning electron microscopes.
Millikan 9 Fl QH212.S3 R452 1985
Images of Materials offers examples of images collected by various techniques.
TITLE Images of materials / edited by David B. Williams, Alan R. Pelton,
Ronald Gronsky ; with a foreword by Peter B. Hirsch.
IMPRINT New York : Oxford University Press, 1991.
COLLATION xiv, 379 p., [32] p. of plates : ill. (some col.) ; 29 cm.
NOTE Includes bibliographical references and index.
CONTENTS Imaging by light optical microscopy / G.F. Vander Voort --
Scanning electron microscopy / D.C. Joy and J.I. Goldstein --
Analytical imaging with a scanning ion microprobe / R. Levi-Setti
Acoustic microscopy / G.A.D. Briggs and M. Hoppe
Transmission electron microscopy / G. Thomas --
Electron diffraction images / D.B. Williams and K.S. Vecchio --
Atomic-resolution microscopy / R. Gronsky
Millikan 6 Fl TA418.7 .I44 1991
TITLE Quantitative electron-probe microanalysis / editors, V.D. Scott
and G. Love.
IMPRINT Chichester, West Sussex, England : E. Horwood ; New York :
Halsted Press, 1983.
COLLATION 345 p. : ill. ; 24 cm.
SERIES Ellis Horwood series in physics.
NOTE Bibliography: p. [320]-336. Includes index.
SUBJECT Electron probe microanalysis.
Microchemistry.
Chemistry, Analytic --Quantitative.
ALT AUTHOR Scott, V. D. (Victor D.), 1928-
Geology QD117.E42 Q36 1983
An introduction to X-ray spectrometry : X-ray fluorescence and electron microprobe analysis is a relatively good text which discusses both instrumentation and quantitation aspects of microanalysis (and related aspects of x-ray fluorescence).
AUTHOR Williams, K. L.
TITLE An introduction to X-ray spectrometry : X-ray fluorescence and
electron microprobe analysis / K.L. Williams.
IMPRINT London ; Boston ; Allen & Unwin, 1987.
COLLATION xiii, 370 p. : ill. ; 25 cm.
NOTE Bibliography: p. 364-366.
Includes index.
SUBJECT Rocks --Analysis.
Mineralogy, Determinative.
X-ray spectroscopy.
Fluorescence spectroscopy.
Microprobe analysis.
Geology QE435 .W55 1987
Electron probe quantitation is a collection of papers that discuss the state-of-the-art of microprobe analysis. It is new. It is not an introductory text.
TITLE Electron probe quantitation / edited by K.F.J. Heinrich and Dale
E. Newbury.
IMPRINT New York : Plenum Press, c1991.
COLLATION viii, 400 p. : ill. ; 26 cm.
NOTE "Result of a gathering of international experts in 1988 at ...
National Institute of Standards and Technology"--Pref.
Includes bibliographical references and index.
SUBJECT Electron probe microanalysis --Congresses.
Microchemistry --Congresses.
Spectroscopy.
ALT AUTHOR Heinrich, Kurt F. J.
Newbury, Dale E.
Geology
Electron Microprobe Analysis is another text which discusses the technique as an overview. There is a new edition which we do not have a copy of.
AUTHOR Reed, S. J. B.
TITLE Electron microprobe analysis / S. J. B. Reed.
IMPRINT Cambridge [Eng] ; New York : Cambridge University Press, 1975.
COLLATION xvi, 400 p. : ill. ; 23 cm.
SERIES Cambridge monographs on physics.
NOTE Bibliography: p. 381-395. Includes index.
SUBJECT Microprobe analysis.
Millikan 8 Fl QD117.E42 R43
Fundamentals of Energy Dispersive X-ray Analysis is an introduction to EDS and offers an in-depth discussion of the instrument and its pros and cons. It is enlightening for the novice and should be read for those sem users who do EDS analysis.
AUTHOR Russ, John C.
TITLE Fundamentals of energy dispersive x-ray analysis / John C. Russ.
IMPRINT London ; Boston : Butterworths, 1984.
COLLATION 308 p. : ill. ; 24 cm.
SERIES Butterworths monographs in materials.
NOTE Bibliography: p. 295-304. Includes index.
SUBJECT X-ray spectroscopy.
Millikan 8 Fl QD96.X2 R87 1984
Microbeam Analysis are the proceedings volumes of the annual meeting of the Microbeam Analysis Society. These volumes contain almost all research papers (as extended abstracts) concerning various aspects of electron microprobe analysis. A bibliographic database of papers from these proceedings is under construction.
TITLE Microbeam analysis.
COVERAGE 14th (1979)-
IMPRINT San Francisco, Calif. : San Francisco Press, c1979-
FREQUENCY Annual.
COLLATION v. : ill. ; 29 cm.
LIB. HAS GEOL has: 14th (1979)+
Millikan 9th floor has: 16th (1981), 17th (1982), 19th (1984)+
NOTE Proceedings of the 14th- Annual Conference of the Microbeam
Geology QH212.E4 N3 1981
CITZAF: A Package of Correction Programs for the Quantitative Electron Microbeam X-ray Analysis of Thick Polished Materials, Thin Films, and Particles, John T. Armstrong, Microbeam Analysis, 4 (1995), 177-200.
TITLE Modern powder diffraction / D.L. Bish and J.E. Post, editors.
IMPRINT Washington, D.C. : Mineralogical Society of America, c1989.
COLLATION xi, 369 p. : ill. ; 23 cm.
SERIES Reviews in mineralogy ; v. 20.
NOTE Includes bibliographies.
SUBJECT X-rays -- Diffraction.
Mineralogy, Determinative.
ALT AUTHOR Bish, David L.
Post, Jeffrey Edward.
Geology QE369.X2 M62 1989
X-ray diffraction procedures for polycrystalline and amorphous materials is an in-depth reference that covers some aspects of x-ray diffraction in greater depth than the previous reference.
AUTHOR Klug, Harold Philip, 1902-
TITLE X-ray diffraction procedures for polycrystalline and amorphous
materials [by] Harold P. Klug [and] Leroy E. Alexander.
IMPRINT New York, Wiley [1954]
COLLATION 716 p. illus. 24 cm.
NOTE RETRO 6.
SUBJECT X-rays -- Diffraction.
ALT AUTHOR Alexander, Leroy Elbert, 1910-
Millikan 7 Fl QC482 .K5
Geology QC482 .K5
TITLE X-ray fluorescence analysis in the geological sciences : advances
in methodology / S.T. Ahmedali, editor ; contributors, S. Abbey [et
al.]
IMPRINT St. John's, Nfld. : Geological Association of Canada =
Association geologique du Canada, 1989.
COLLATION xii, 297 p. : ill. ; 28 cm.
SERIES Short course notes (Geological Association of Canada) ; v. 7.
NOTE Includes bibliographical references.
SUBJECT X-ray spectroscopy.
Analytical geochemistry.
ALT AUTHOR Ahmedali, S. T. (Syed Tariq), 1941-
Geological Association of Canada.
Geology QD96.X2 X729 1982
Advances in x-ray analysis : proceedings of the annual Conference on Application of X-ray Analysis are the proceedings of an annual conference on x-ray analysis. These volumes contain older papers on x-ray analysis.
AUTHOR Conference on Application of X-ray Analysis.
TITLE Advances in x-ray analysis : proceedings of the annual Conference
on Application of X-ray Analysis.
COVERAGE Vol. 1 (6th/1957)-
IMPRINT New York, London, Plenum Press, 1960-
FREQUENCY Annual.
COLLATION v. ill. 24-28cm.
LIB. HAS GEOL has: v.1 (1957)-v.24 (1980), v.26 (1982)+
Geology TA417.65 .C6 v.1 (1957)